8D報告案例模板example

1、. REF header_page_2 h Customer nameCustomer ref.Customer Prod. NoST Complaint Ref.ST Commer. productARRAY ELECTRONICS LTD.F040358000FQS TDA2007A：.；Note: This report which results from a failure analysis performed in good faith by STMicroelectronics solely to help the Customer understand the origin a

2、nd cause of the problem. It enables the Customer and STMicroelectronics to discuss in an amicable manner a mutually acceptable remedial and technical action plan. This report does not imply for STMicroelectronics expressly or implicitly any contractual obligations other than as set forth in STMicroe

3、lectronics General Terms and Conditions of Sale.This report and its contents shall not be disclosed to a third party without previous written agreement from STMicroelectronics.Page PAGE 1CUSTOMER COMPLAINT - FINAL REPORT8D Report number: F040358000FQS -8DGLOBAL INFORMATION8D Close Date:February 04,

4、2004CUSTOMER NAME:ARRAY ELECTRONICS LTD.Customer contact:Tony ChenCustomer ref.:Customer part number:Area ref. number:NA401012ST creator:Mr Gary HUA, Field Quality Service Asia PacificST manager:(8D report creator)Mr. Bt LEE, Muar plant Quality & Reliability St ref.:F040358000FQS ST commercial produ

5、ct:TDA2007AST Distribution list:Mr Blancky HO, Field Quality Service Asia PacificMrs Cathy LI, Field Quality Service Asia PacificEDDY GAN, PDIP TESTMr Gary HUA, Field Quality Service Asia PacificSP LOW, QA / FAMr Austin WU, Field Quality Service Asia PacificReport approved by:Title:Date:Signature:BT

6、 LEECHIEF FA ENGINEER04 Feb 04Report prepared by: SP LOWFA ENGINEER04 Feb 04Page PAGE 2Detail informationComplaint informationCustomer date:January 19, 2004ST creation date:January 19, 2004ST evidence received date (by FAR Mgr.):January 26, 2004Quantity received by ST:12Quantity affected at Customer

7、:Customer failure rate (ppm):Origin of the defect:ManufacturingCustomer symptom description:The end cusomer believes this part has potential risk.Customer contact:Tony ChenST complaint creatorMr Gary HUA, Field Quality Service Asia PacificST complaint manager:(8d report creator)Mr. Bt LEE, Muar plan

8、t Quality & Reliability Device informationCustomer part # :ST commercial product :TDA2007AST raw line #:BA7A*L443CAX Product family (code & description):70 AUDIO SYSTEMSPackage:7A SIL 9Wafer fab. process:OF MT/-HWafer fab.:0857 AMKF AMK 5; CFMAssembly fab.:0959 MU1A ST MUAR - MALAYSIATest plant:0959

9、 MU1T ST MUAR - MALAYSIA中國3000萬經(jīng)理人首選培訓(xùn)網(wǎng)站更多免費資料下載請進： HYPERLINK 55top 55top好好學(xué)習(xí)社區(qū)8D RESULTS SYNOPSIS / PROBLEM DESCRIPTIONDominant defect description:1: EOS, ESD2: EOS - ESD3: EOS - ESD generalSample RefQty QA numberTracecode19W99CE034123W99CD0341Root Cause:Application / Electrical overstressContainme

10、nt action:Implementation date:None.February 04, 2004Corrective action:Implementation date:Not ApplicableFebruary 04, 20048D REPORT DETAILS: F040358000FQS -8DST Analysis results synopsisDominant defect description:1: EOS, ESD2: EOS - ESD3: EOS - ESD generalSample RefQty QA numberTracecode19W99CE03412

11、3W99CD03411D Team8D team leader :Mr. Bt LEE, Muar plant Quality & Reliability Team members :EDDY GAN, PDIP TESTSP LOW, QA / FA2D Problem descriptionCustomer symptomSample:1Cust. symptom description: the end cusomer believes this part has potential risk.Sample:2Cust. symptom description: the end cuso

12、mer believes this part has potential risk.Symptom comments11 units were tested failed catastropy. Burnt marks due to electrical overstress were observed. 1 unit was tested good in ATE.Muar FA Findings:StepsFindingsExternal visual inspectionOnly 3 units with tracecodeW99CE0341 have unbroken leads, th

13、e other 9 units were having broken leads.Curve tracingLeakage or short at Pin 8 or Pin 9 vs ground except for unit with reference #1.X-raysNo anomalies.ATEOnly unit with reference #1 was tested good in ATE, the other 11 units were tested fail Bin #6, #27 and #28.Decapsulation-Internal visual inspect

14、ionBurnt marks were observed on die top between Pin 8 and Pin 9 rails for units with reference #4, #5, #10 and #11. Note: Units with reference #1 to #9 are from tracecode W99CE0341; units with reference #10 to #12 are from tracecode W99CD0341.Enclosure:Pin 9 of Unit Reference #10Pin 8 of Unit Refere

15、nce #11Pin 9 of Unit Reference #11Pin 8 of Unit Reference #4Pin 9 of Unit Reference #4Pin 8 of Unit Reference #5Pin 9 of Unit Reference #53D Containment actionNot Applicable.4D CauseArea involvedMacro process:CUSTOMERLocation:CUSTOMERProcess step:APPLICATION (EOS)Root causeRoot cause:Application / E

16、lectrical overstressDefect intentionally reproduced:Escape root cause description:Not Applicable.Problem root cause description:Not Applicable.5D Corrective action & VerificationNot Applicable.6D Implementation of permanent corrective actionNot Applicable.7D PreventionRevised Quality System Doc.Refe

17、rence & version changesDate of create-updateError of process: NOControl plan Ref.:Not applicableError of application: YESFailure Modes Effects Analysis Ref.:Not applicableSpecification Ref.:Not applicableCross-fertilization Ref.:Not applicableText - Comments :Not required since the unit was failed d

18、uring the customers application.8D Information & ConclusionStatus:CompletedClose date:February 04, 2004Estimated date of parts delivery after containmentAdditional comments:None.Electrical Analysis ANALYSIS DATA AND RESULTS : Sample ref.:F040358000FQS -EA1 - 2Units ser. no:All unitsFail type:StableCorrelation with customer:noElectrical defect:1- TESTING2- DC tests3- Short.Remark:All units were tested failed catastropy in ATE.Sample ref.:F040358000FQS -EA1 - 1Units ser. no:All unitsFail type:StableCorrelation with customer:noElectrical defect:1- TESTING2- DC tests3- Sh