ThermoICP技術(shù)培訓(xùn)ppt課件

1、IRIS Intrepid - System OverviewICP技術(shù)培訓(xùn)ICP的根本原理IRIS Intrepid光譜儀的構(gòu)造IRIS Intrepid的操作及日常維護(hù)ICP常見(jiàn)缺點(diǎn)的診斷及排除如何在檢測(cè)任務(wù)中發(fā)揚(yáng)ICP的特點(diǎn)與優(yōu)勢(shì)ICP的根本原理原子發(fā)射光譜的根本原理ICP的產(chǎn)活力理與安裝ICP的進(jìn)樣系統(tǒng)樣品在ICP中的微觀(guān)過(guò)程中階梯光柵光學(xué)系統(tǒng)CID檢測(cè)器的任務(wù)原理原子發(fā)射光譜的根本原理原子構(gòu)造與原子光譜原子光譜的發(fā)現(xiàn)與運(yùn)用ICP的產(chǎn)活力理與安裝ICP的產(chǎn)活力理與安裝任務(wù)線(xiàn)圈炬管點(diǎn)火安裝ICP構(gòu)成過(guò)程ICP的產(chǎn)活力理與安裝ICP的參數(shù)分布溫度電子垂直察看尾焰自吸干擾離子譜線(xiàn)區(qū)最正確分析

2、區(qū)原子譜線(xiàn)區(qū)原子化區(qū)EIE干擾區(qū)垂直察看最小的背景干擾程度觀(guān)測(cè)靈敏度高，檢出限低基體簡(jiǎn)單的條件下優(yōu)點(diǎn)缺乏 1)Plasma Loading Effects 基體效應(yīng) 、炬管易沾污 2)Easily Ionizable Element (EIE) effects 易電離干擾適用：環(huán)保、水質(zhì)、醫(yī)療、防疫等基體簡(jiǎn)單的領(lǐng)域Instrument Optics 雙向察看光路圖計(jì)算機(jī)自動(dòng)控制雙向切換，可實(shí)現(xiàn)：垂直察看、程度察看或一次分析中部分元素垂直丈量部分元素程度丈量LensTorch with holeQuartz WindowFixed MirrorPOPModified forDualViewing

3、Fixed Mirror雙向察看實(shí)踐上是程度察看為主，附加垂直察看能有效處理程度察看中存在的EIE干擾ICP的進(jìn)樣系統(tǒng)噴霧器霧室蠕動(dòng)泵ICP的進(jìn)樣系統(tǒng)噴霧器同心型ICP的進(jìn)樣系統(tǒng)噴霧器交叉型ICP的進(jìn)樣系統(tǒng)噴霧器超聲霧化器ICP的進(jìn)樣系統(tǒng)霧室筒型梨型旋流型ICP的進(jìn)樣系統(tǒng)其他技術(shù)蠕動(dòng)泵氣體發(fā)生法及其安裝膜去溶技術(shù)及安裝樣品在ICP中的微觀(guān)過(guò)程去溶氣化解離電離激發(fā)中階梯光柵光學(xué)系統(tǒng)The Echelle SpectrometerIRIS/Intrepid optical layout two “active optical components: an echelle grating and a

4、 prism grating = wavelength separation (high, overlapping orders) prism = optical separation of the orders is achieved by cross- dispersion (“order sorter) the resulting spectrum image is rectangular uses a bi-dimensional detector to capture the spectrum (CID)CID檢測(cè)器的任務(wù)原理CID檢測(cè)器的任務(wù)原理VinjectVinjectVint

5、egrateVintegrateVtransferVinjectVintegrateVinjectVintegrateVinjectVintegrateVinjectVintegrateVtransferVinjectVintegrateVtransferVinjectVintegrateVtransferrowcolumnrowcolumnrowcolumnrowcolumnB. 1st voltage sampleA. integrateC. 2nd voltage sampleD. injectNDRODROIRIS Intrepid光譜儀的構(gòu)造控制系統(tǒng)電源RF系統(tǒng)光學(xué)系統(tǒng)檢測(cè)系統(tǒng)輔助安

6、裝IRIS Intrepid - System OverviewSample Introduction SystemRF GeneratorPneumatic System (Gas Flows)Optical System(Echelle Spectrometer)Detection and Acquisition ElectronicsIRIS/Intrepid CPUPlasma Control ElectronicsAutosamplerData StationCIDNot used Pneumatics CID/RF Coil Cooling (water circuit) Tank

7、 Heating Peristaltic PumpAuxiliary Systems:IRIS Intrepid - System Overview控制系統(tǒng)計(jì)算機(jī)與軟件386板信號(hào)板PSCB板Data Station/SoftwareCIDPlasma ControlMicroprocessorIRIS Intrepid - System OverviewCID ControlProcessing / Control Electronics電源交流220V/110V/24V/5V直流3800V/48V/15V/-15V/12V/5VPower Cube Interconnect Diagram

8、Note: See CSA modification sheets for fuse location and ratingRF System (and Lower Chassis) Supplies OnRF系統(tǒng)RF SourceRF DriverPower AMP BoxRF Control SystemRF Block Diagram RF Source Driver Amplifier Power Amplifier Plasma Section Control Board Reflected Power (Phase) Loop DAGC Signal+DAGC Signal-Ano

9、de ReturnAnode I Sense(Cathode Bias Board)-AGC (RF Detector) RF PassRF ShuntBias DriveBias senseDA/PA Feedback SwitchRF Setpoint RF Block Diagram HV 3850VHV 3850VIgnition Feedback Circuit Reflected Power LoopRF Block Diagram - IgnitionHV 3850VIncident Power Feedback Circuit Reflected Power LoopRF Bl

10、ock Diagram Plasma On光學(xué)系統(tǒng),檢測(cè)系統(tǒng)光源外光路內(nèi)光路(單色器)檢測(cè)器The IRIS/Intrepid OpticsCID DetectorFocusingMirrorPrismCollimatingMirrorShutterEntrance SlitThe IRIS/Intrepid OpticsCID DetectorFocusingMirrorPrismCollimatingMirrorShutterSlit(dual)IRIS/Intrepid CID Camera輔助系統(tǒng)光室恒溫安裝循環(huán)水系統(tǒng)半導(dǎo)體制冷系統(tǒng)氣路Water Flow DiagramWater:

11、Camera cooling RF coil coolingIntrepid II Pneumatic CircuitRF Interconnect Diagram (and Lower Chassis)The Peltier EffectCurrent flowing through a junction leads to change in temperatureMaterial: Bismuth Telluride (Bi2Te3)RF Interconnect Diagram (and Lower Chassis)TE CoolerCamera and Tank Interconnec

12、t Diagram Auxiliary SystemsTE CoolerIRIS Intrepid的操作及日常維護(hù)儀器的預(yù)備分析方法的建立數(shù)據(jù)的采集處置軟件系統(tǒng)的維護(hù)硬件的日常保養(yǎng)儀器的預(yù)備光學(xué)系統(tǒng)的恒溫檢測(cè)器的冷卻ICP的產(chǎn)生與穩(wěn)定光學(xué)系統(tǒng)的準(zhǔn)直(譜線(xiàn)定位)儀器的預(yù)備-光室恒溫恒溫要求:90+/-0.5FCamera and Tank Interconnect Diagram Auxiliary SystemsTank Heating Circuit儀器的預(yù)備-CID冷卻冷卻要求CID溫度5度IRIS/Intrepid CID CameraRF Interconnect Diagram (a

13、nd Lower Chassis)TE Cooler Power SupplyInterlocks: Ar Pressure Water Flow Water TemperatureThermistor(cold temp) Temperature Setpoint TP2 V output儀器的預(yù)備-點(diǎn)火及穩(wěn)定點(diǎn)火的本卷須知Ar進(jìn)樣系統(tǒng)廢液泵夾抽風(fēng)穩(wěn)定時(shí)間:15-45min儀器的預(yù)備譜線(xiàn)定位波長(zhǎng)校準(zhǔn)譜線(xiàn)描跡Routine Analysis - The Subarray建立分析方法選擇分析的元素與譜線(xiàn)設(shè)置儀器的形狀參數(shù)Plasma參數(shù)丈量參數(shù)定置任務(wù)曲線(xiàn)設(shè)置數(shù)據(jù)的處置方式,輸出格式建立分析方法

14、譜線(xiàn)選擇強(qiáng)度適宜干擾少波長(zhǎng)差強(qiáng)度比建立分析方法儀器參數(shù)SOURCE SETTINGPOWERNEB AUX GASPUMP SPEED建立分析方法儀器參數(shù)分析參數(shù)積分時(shí)間察看方式建立分析方法儀器參數(shù)任務(wù)曲線(xiàn)濃度含量擬合方式建立分析方法儀器參數(shù)數(shù)據(jù)處置Subarray背景校正IECs校正輸出格式Routine Analysis - The SubarrayNet Signal = Sl - (Sl + Sr )/2The subarray informationis stored for each analysis to allow post-processing of data.數(shù)據(jù)的采集與處

15、置采集并計(jì)算任務(wù)曲線(xiàn)丈量未知樣品數(shù)據(jù)后處置定性及半定量分析儀器的日常維護(hù)軟件系統(tǒng)的維護(hù) -分析方法的保管與備份 -重要數(shù)據(jù)的保管與備份 -軟件系統(tǒng)的加密儀器的日常維護(hù)硬件維護(hù)進(jìn)樣系統(tǒng)維護(hù)光路的維護(hù)檢測(cè)器維護(hù)(吹掃氣枯燥)循環(huán)水的改換電源維護(hù)RF匹配箱維護(hù)風(fēng)扇,散熱片與過(guò)濾網(wǎng)進(jìn)樣系統(tǒng)維護(hù) 蠕動(dòng)泵壓板的優(yōu)化泵管改換霧化器堵塞的處置，Neb氣過(guò)濾器的改換霧化室的清洗- 1%(V/V)HF酸，12分鐘不能馬上分析微量Si、B、Na。中心管和炬管的清洗一切銜接處、O型圈的密封廢液管的處置.儀器的日常維護(hù)硬件維護(hù)光路的維護(hù) 狹縫 透鏡 后反光鏡儀器的日常維護(hù)硬件維護(hù)檢測(cè)器維護(hù)(吹掃氣枯燥) 定期檢查定期改

16、換循環(huán)水的改換 定期改換儀器常見(jiàn)缺點(diǎn)的排除控制與通訊問(wèn)題點(diǎn)火問(wèn)題數(shù)據(jù)檢測(cè)問(wèn)題其他問(wèn)題儀器常見(jiàn)缺點(diǎn)的排除控制通訊問(wèn)題自檢不正常不通訊INTERLOCK任務(wù)異常儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題不能正常點(diǎn)火非正常熄火儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題點(diǎn)火的三個(gè)條件: RF系統(tǒng)輸出適宜的能量 好的炬管與純的Ar 點(diǎn)火安裝放出一定量的電荷RF Block Diagram RF Source Driver Amplifier Power Amplifier Plasma Section Control Board Reflected Power (Phase) Loop DAGC Signal+DAGC Signal-

17、Anode ReturnAnode I Sense(Cathode Bias Board)-AGC (RF Detector) RF PassRF ShuntBias DriveBias senseDA/PA Feedback SwitchRF Setpoint RF Block Diagram HV 3850VPLASMA點(diǎn)燃的過(guò)程RF啟動(dòng)冷卻風(fēng)機(jī)任務(wù)；翻開(kāi)吹掃氣、霧化氣(30psi)、輔助氣、冷卻氣驅(qū)除炬管中的空氣。驅(qū)氣90秒，先封鎖霧化氣，啟動(dòng)高壓，點(diǎn)火頭任務(wù)，RF發(fā)生器提供點(diǎn)火功率(Ip=160-200mA)。PLASMA點(diǎn)燃，點(diǎn)火頭停頓任務(wù)，RF功率切換到1550W，AGC任務(wù)。PL

18、ASMA 任務(wù)參數(shù)切換到點(diǎn)火設(shè)定參數(shù)(1150W、30psi、low Axu、100rpm )儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題點(diǎn)火的過(guò)程中IP的變化0mA30mA180mA600mA儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題IP0mA 無(wú)高壓(VP)? 燈絲電壓? 功率管座子?儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題IP30mA RF系統(tǒng)缺點(diǎn),確認(rèn)48V?儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題IP150-250mA Ar? 點(diǎn)火頭? 炬管?儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題IP600mA 高壓漏電,停頓實(shí)驗(yàn)!儀器常見(jiàn)缺點(diǎn)的排除點(diǎn)火問(wèn)題非正常滅火 滅火時(shí)間 蠕動(dòng)泵,NEB氣的動(dòng)作 儀器的提示儀器常見(jiàn)缺點(diǎn)的排除數(shù)據(jù)檢測(cè)問(wèn)題靈敏度低穩(wěn)定性差回讀不好丈量結(jié)果有系統(tǒng)誤差儀器常見(jiàn)缺點(diǎn)的排除數(shù)據(jù)檢測(cè)問(wèn)題靈敏度低 光源問(wèn)題(ICP,進(jìn)樣) 光路問(wèn)題(快門(mén)等) 檢測(cè)部分儀器常見(jiàn)缺點(diǎn)的排除數(shù)據(jù)檢測(cè)問(wèn)題穩(wěn)定性差 光源(RF,進(jìn)樣) 光路(狹縫,透鏡)如何在檢測(cè)任務(wù)中發(fā)揚(yáng)ICP的特點(diǎn)與優(yōu)勢(shì)充分了解儀器充分了解樣品抓住主要矛盾建立好的方法如何在檢測(cè)任務(wù)中發(fā)揚(yáng)ICP的特點(diǎn)與優(yōu)勢(shì)合理處置樣品:分解完全,不損失,不污染適當(dāng)?shù)臉悠窛?/p>