標(biāo)準(zhǔn)解讀

《GB/T 44795-2024 系統(tǒng)級封裝（SiP）一體化基板通用要求》是一項(xiàng)國家標(biāo)準(zhǔn)，旨在為系統(tǒng)級封裝技術(shù)中使用的集成化基板提供一套全面的技術(shù)規(guī)范。該標(biāo)準(zhǔn)適用于各種類型的SiP產(chǎn)品設(shè)計(jì)與制造過程中的基板選擇、設(shè)計(jì)及測試驗(yàn)證環(huán)節(jié)。它定義了SiP一體化基板的基本性能指標(biāo)、材料特性、結(jié)構(gòu)設(shè)計(jì)原則以及質(zhì)量控制方法等方面的內(nèi)容。

在材料方面，《GB/T 44795-2024》規(guī)定了用于制作SiP基板所需的各種材料應(yīng)滿足的物理化學(xué)性質(zhì)要求，包括但不限于熱膨脹系數(shù)、導(dǎo)電率、介電常數(shù)等關(guān)鍵參數(shù)，并對不同應(yīng)用場景下推薦使用的具體材質(zhì)進(jìn)行了說明。

對于結(jié)構(gòu)設(shè)計(jì)而言，該標(biāo)準(zhǔn)詳細(xì)描述了如何根據(jù)實(shí)際需求來規(guī)劃合理的布局方案，比如信號傳輸路徑優(yōu)化、電源分配網(wǎng)絡(luò)設(shè)計(jì)等，同時(shí)給出了關(guān)于層間連接方式的選擇指導(dǎo)，如通孔、盲孔或埋孔的應(yīng)用條件和優(yōu)缺點(diǎn)比較。

此外，《GB/T 44795-2024》還特別強(qiáng)調(diào)了對成品進(jìn)行嚴(yán)格的質(zhì)量檢驗(yàn)程序，明確了外觀檢查、電氣性能測試、環(huán)境適應(yīng)性試驗(yàn)等多項(xiàng)評估內(nèi)容及其相應(yīng)的方法步驟。通過這些標(biāo)準(zhǔn)化流程可以有效確保最終產(chǎn)品的可靠性和一致性。


如需獲取更多詳盡信息，請直接參考下方經(jīng)官方授權(quán)發(fā)布的權(quán)威標(biāo)準(zhǔn)文檔。

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文檔簡介

ICS31.200

CCSL56

中華人民共和國國家標(biāo)準(zhǔn)

GB/T44795—2024

系統(tǒng)級封裝（SiP）

一體化基板通用要求

Generalrequirementsforintegralsubstrate

ofSysteminPackage（SiP）

2024?10?26發(fā)布2024?10?26實(shí)施

國家市場監(jiān)督管理總局

國家標(biāo)準(zhǔn)化管理委員會發(fā)布

GB/T44795—2024

目次

前言··························································································································Ⅲ

1范圍·······················································································································1

2規(guī)范性引用文件········································································································1

3術(shù)語和定義··············································································································1

4總體要求·················································································································1

4.1通則·················································································································1

4.2文件優(yōu)先順序·····································································································1

4.3一體化基板類型··································································································2

5特性定義要求···········································································································2

5.1總則·················································································································2

5.2電氣特性···········································································································2

5.3熱特性··············································································································2

5.4結(jié)構(gòu)特性···········································································································2

6設(shè)計(jì)要求·················································································································3

6.1總則·················································································································3

6.2一體化厚膜基板設(shè)計(jì)要求······················································································3

6.3一體化薄膜基板設(shè)計(jì)要求······················································································4

6.4一體化厚薄膜混合基板設(shè)計(jì)要求·············································································5

6.5一體化有機(jī)印制基板設(shè)計(jì)要求················································································6

7驗(yàn)證要求·················································································································7

7.1總則·················································································································7

7.2驗(yàn)證方案···········································································································7

7.3仿真模型···········································································································7

7.4試制驗(yàn)證···········································································································7

7.5建模提參···········································································································7

8制造要求·················································································································8

8.1總則·················································································································8

8.2驗(yàn)證與制造一致性·······························································································8

8.3關(guān)鍵工序與特殊過程····························································································8

8.4質(zhì)量控制···········································································································8

8.5工藝模型庫········································································································8

8.6環(huán)境要求···········································································································8

9檢驗(yàn)要求·················································································································8

Ⅰ

GB/T44795—2024

9.1總則·················································································································8

9.2靜態(tài)指標(biāo)檢驗(yàn)·····································································································9

9.3環(huán)境性能試驗(yàn)·····································································································9

10交付要求···············································································································9

10.1標(biāo)識················································································································9

10.2文件··············································································································10

11產(chǎn)品轉(zhuǎn)運(yùn)、貯存要求································································································10

11.1轉(zhuǎn)運(yùn)··············································································································10

11.2貯存··············································································································10

附錄A（資料性）基板設(shè)計(jì)典型參考值·············································································11

A.1一體化厚膜基板································································································11

A.2一體化薄膜基板································································································13

A.3一體化厚薄膜混合基板·······················································································15

A.4一體化有機(jī)印制基板··························································································15

參考文獻(xiàn)····················································································································17

Ⅱ

GB/T44795—2024

前言

本文件按照GB/T1.1—2020《標(biāo)準(zhǔn)化工作導(dǎo)則第1部分：標(biāo)準(zhǔn)化文件的結(jié)構(gòu)和起草規(guī)則》的規(guī)

定起草。

請注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機(jī)構(gòu)不承擔(dān)識別專利的責(zé)任。

本文件由中華人民共和國工業(yè)和信息化部提出。

本文件由全國集成電路標(biāo)準(zhǔn)化技術(shù)委員會（SAC/TC599）歸口。

本文件起草單位：中國電子科技集團(tuán)公司第二十九研究所、中國科學(xué)院微電子研究所、清華大學(xué)、

電子科技大學(xué)、廈門云天半導(dǎo)體科技有限公司、成都邁科科技股份有限公司。

本文件主要起草人：李彥睿、王春富、徐洋、邊方勝、賈松良、于慧慧、季興橋、陸吟泉、呂拴軍、

秦躍利、徐榕青、向偉瑋、王文博、張健、徐諾心、萬里兮、于大全、張繼華、李勇、龔小林、高明起、王娜、

張剛、張湉、徐飛。

Ⅲ

GB/T44795—2024

系統(tǒng)級封裝（SiP）

一體化基板通用要求

1范圍

本文件規(guī)定了系統(tǒng)級封裝（SiP）一體化基板通用要求，包括一體化基板總體要求、特性定義、設(shè)計(jì)、

驗(yàn)證、制造、

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