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期末復(fù)習(xí)專業(yè)外語考試題型一、漢譯英(20分)10個詞,每個詞2分二、英譯漢(20分)10個詞,每個詞2分三、翻譯句子(40分)10個句子,每個句子4分四、翻譯(20分)一整段或者幾個句子考試注意事項一、考試時間:2個小時
7月11日9:00-11:00經(jīng)信F2二、不允許帶詞典(包括電子詞典)三、手機關(guān)機(用手表看時間)四、不允許上廁所五、交卷要在一個小時十分鐘之后!?。?fù)習(xí)題一、掌握(給出漢語可以寫成英文)semiconductor:半導(dǎo)體photoconductivity:光電導(dǎo)性(率)rectification:整流intrinsicproperties:本征特性Halleffect:霍爾效應(yīng)currentcarriers:載流子carriermobility:載流子遷移率silicon:硅(Si)germanium:鍺(Ge)solarcell
:太陽電池一、掌握(給出漢語可以寫成英文)alkali
halide:堿金屬鹵化物transistor:晶體管solid-statelaser
:固體激光器opticalfiber:光纖quantummechanics:量子力學(xué)potentialbarrier:勢壘,位壘periodiclattice:周期點陣activationenergy:激活能electron-holepairs:電子、空穴對dislocation:位錯一、掌握(給出漢語可以寫成英文)ionimplantation:離子注入fieldeffect-transistor:場效應(yīng)晶體管wafer:晶片Wetchemicaletching:濕法化學(xué)刻蝕diffractioneffect:衍射效應(yīng)birefringent:雙折射的indexofrefraction:折射率focallength:焦距
donor:施主acceptor:受主一、掌握(給出漢語可以寫成英文)interferencecontrast:干涉相稱valenceelectron:價電子Liquidphaseepitaxy(LPE):液相外延Fieldeffect-transistor(FET):場效應(yīng)晶體管Integratedcircuit(IC):集成電路Light-emittingdiode(LED):發(fā)光二極管Metal-Oxide-Semicondutor(MOS):金屬氧化物半導(dǎo)體;physicalvapordeposition(PVD):物理氣相沉積;chemicalvapordeposition(CVD):化學(xué)氣相沉積numericalapertures(NA):數(shù)值孔徑negativetemperaturecoefficientofresistance:電阻的負溫度系數(shù)silversulphidel:硫化銀poly-crystallineingots:多晶塊titanium:鈦(Ti)zirconium:鋯(Zr)tellurium:碲(Te)leadsulphide:硫化鉛ironpyrites:黃鐵礦selenium:硒(Se)copper:銅二、認識(給出英語能翻譯成漢語)Transmissionpolarizedlightmicroscopy:透射偏光顯微術(shù)wavelength:波長radioreceivers:無線射頻接收器、無線電接收機galena:方鉛礦photocell:光電管、光電池copperoxide:氧化銅crystaldetector:晶體檢波器vacuumtube:真空管infrareddetector:紅外探測器fieldsofforce:力場二、認識(給出英語能翻譯成漢語)N-folddegenerate:N度簡并oscillator:振子Pauliprinciple:泡利不相容原理excitedstates:激發(fā)態(tài)potentialbarrier:勢壘、位壘magnesium:鎂filledband:滿帶emptyband:空帶thermallyexcited:熱激發(fā)intrinsicconduction:本征導(dǎo)電二、認識(給出英語能翻譯成漢語)二、認識(給出英語能翻譯成漢語)X-raytopography:X射線形貌學(xué)OpticalMicroscopy:光學(xué)顯微術(shù)(鏡)stackingfault:層錯Etchant:蝕刻劑crystallography:結(jié)晶學(xué)polishingetch:拋光腐蝕selectiveetch:選擇腐蝕avalanche:雪崩anodic:陽極的cathodic:陰極的infraredspectroscopy:紅外光譜學(xué)二、認識(給出英語能翻譯成漢語)Cr:chromium:鉻depthoffield:景深,視場深度resolution:分辨率
compoundmicroscope:復(fù)顯微鏡magnification:放大倍數(shù)(倍率)transmittedlightmicroscope:透射式光學(xué)顯微鏡reflectionmicroscopy:反射顯微技術(shù)
Czochralskigrowth:提(直)拉法生長
polarize:偏振片、起偏器prism:棱鏡三、句子1、Itis,nevertheless,ahightributetotheskillandcareofmanyexperimentersthat,inspiteofthis,semiconductorshadbeenrecognizedasadistinctclassofsubstancesandtheirmainpropertiesappreciatedlongbeforeacomprehensivetheorywasavailabletoaccountforthem.P12、Theseeffectsarenowknowntobeduetooxidefilmsoractualgapsseparatingtheindividualcrystalsbutledtothemetalstitaniumandzirconiumoncebeinglistedassemiconductors.P13、Itmustbeadmitted,however,thatnoinfalliblecriterionwasavailabletillthequantumtheoryofsolidsgaveanunderstandingofthereasonsforthevariouspropertiesobserved.P14、AreviewofthisearlyworkhasbeengivenbyK.Lark-Horowitztogetherwithaveryextensivebibliographycontainingover350references.EarlierreviewsbyB'Guddenalsodealextensivelywiththisphaseanddiscussinsomedetailtheproblemsofidentifyingsemiconductors.
P25、Thelatter,whichisgenerallyknownasthecarriermobility,andwhichweshalldefinemorepreciselylatergenerallytendstodecreaseasthetemperatureisraised,especiallyatthehighertemperatures,andthisaccountsforthedecreaseinconductivityofmetalswithincreasingtemperature.
P36、Thesubstancesconcernedweremainlymetallicoxidesandsulphidesandthe‘defect’semiconductorswerethosewithametalliccontentlessthanthatcorrespondingtostoichiometriccomposition,i.c.oxidizedcompounds.
P47、Theimportanceofthisworkwasinshowingthevitalpartplayedbysmalldeviationsfromstoichiometriccompositionindeterminingthepropertiesofcompoundsemiconductors.
P48、Althoughtheyarenotstrictlysemiconductorsbutinsulators,mentionmustbemadeofthelargeamountofresearchcarriedoutbyR.W.Pohlandhiscollaboratorsonthealkalihalides,sincethishelpedgreatlytoclarifymanyofthepropertiesofsemiconductors.P49、Muchoftheuncertaintyoftheearlyworkonsemiconductorsarosethroughafailuretodifferentiatebetweeneffects,whichariseinthebulkofthematerial,andthose,whicharecharacteristicofthesurfaceoroftheinterfacebetweentwodifferentmaterials.P510、Theuseofsinglecrystalshasenablednotonlytheseparationofthebulkandsurfacepropertiesbuthasalsoenabledthesurfaceandtheinterfacebetweentwotypesofsemiconductor,orbetweenasemiconductorandametal,tobestudiedinmuchgreaterdetail.P511、Morerecentlythestudyofamorphoussemiconductorshasledtoafullerappreciationofthoseproperties,suchashighcarriermobility,thatdependprincipallyonthequalityofthecrystalsbeingstudiedandthosemorefundamentalpropertieswhichdonotdependonlong-rangeorder.P512、Thephotoconductivepropertiesofselenium,andofcopperoxide,havebeenusedtoprovideexposuremetersforphotographyandphotocells,whichareusedinthefilmindustryfortransformingthemarkingsonthesoundtrackintoelectriccurrentsforimplicationandreproductionbyloud-speakers.P513、Thediscoverythatafinewire,or‘cat’swhisker,incontactwithacrystalofsemiconductingmaterialmadeanexcellentrectifierforhigh-frequencycurrentsledtoagreatincreaseinthesensitivityofradioreceivers,andthistypeofdevicewaswidelyusedintheearlydaysofbroadcasting.P614、Themodernsuccessortothetransistoristheintegratedcircuit(IC.)inwhichmanytransistorsandtheirassociatedcomponentssuchasresistors,capacitorsetc.areproducedbycontrolleddiffusionofimpuritiesintoasmall‘chip’ofsilicon.P715、Heretheseforcesaresupposedtoattracttheelectronstronglyifitmovesoutsidetheboundary,andinthesimplestformofthetheoryitisassumedthattheysetupanimpenetrablepotentialbarrierwhichholdstheelectronsinthesolid.
P816、InSummerfield’stheory,theallowedenergylevelsforthevalenceelectronsofacrystalofmacroscopicdimensionslieveryclosetogetherandtheirvaluesextendfromnearlythebottomofthepotentialtroughinwhichtheelectronsmovetoindefinitelyhighvalues.
P917、IfnowwehaveNatomsinacrystal,andweassumethecrystaltobeexpandedsothatthelatticespacingbecomesverygreat,thentheallowedenergylevelswillbejusttheatomicenergylevelswhich,forthemoment,weshallassumetobenon-degenerate,i.e.eachhasaseparateenergy.
P1118、Thisnotonlyexplainswhy‘inner’electronsdonotcontributetoconductionbutitgaveWilsonthecluetotheessentialdeferencebetweenmetalsontheonehandandinsulatorsandsemiconductorsontheother.P1219、Mostofthesubstanceswithwhichweshallbeconcernedhavesuchastructure,butmaynotalwaysconsistoflargesinglecrystalsbutofaggregatesofverysmallcrystalswithrandomorientation.
P1320、Thenumberofexcitedelectronswouldincreasewithtemperatureinamannergovernedbyaprocesshavingan‘a(chǎn)ctivationenergy’,oftheorderofΔEandweshouldexpectarapidincreaseoftheconductivitywithtemperature.P1421、AsweshallalsoseelatertheeffectofverysmallamountsofimpuritycanhaveamarkedeffectonthisactivationenergysothatmaterialswhichhaveconsiderablygreatervaluesofAEmaybehaveassemiconductorswhentheycontaincertain‘a(chǎn)ctive’impurities.P1422、IfweassumethatthevariationwithTofthemobilityofelectronsandholesinanelectricfieldissmallcomparedwiththevariationintheexponentialfactorin(4)thenwehavefortheconductivityσ,whichisthensimplyproportionaltothenumberofcarriers,avariationoftheform.
P1523、Inmanyinstances,itisfoundthattheenergyrequiredtoexciteanelectronintotheconductionbandfromadonorlevelissosmallthattheelectronsfromall,theavailabledonorlevelsareexcitedandareintheconductionbandatroomtemperature.
P1624、Hence,forasemiconductorinthisconditiontheresistancewillincreasewithincreasingtemperature,tillatemperatureisreachedatwhichtheintrinsicelectronsbegintopredominate,whenitwillbegintofallexponentiallyinthemanneroncethoughttobecharacteristicifsemiconductors.
P1625、Whenlightfrequencyishighenoughsothataquantumabsorbedbyavalenceelectronhassufficientenergytoraiseitfromthetopofthefullbandtotheconductionband,extracarriersarecreatedandtheseleadtoincreasedconductivity.P1726、Itwillbeclearfromtheabovecalculationthatifgermaniumistobeintrinsicatroomtemperatureitmustbefreefromimpuritiesgivinglevelsneartheconductionbandtobetterthanonepartin109.
P1827、Itisanticipatedthatthereaderwillhavea"hands-on"involvementwithetchingandopticalmicroscopy,butitisexpectedthatwithX-raytopography,theappropriatespecialistwillperformtheworkandhelpinterprettheresults.
P1828、Itturnsout,however,thattheminoritycarriersarenevertheless,ofgreatimportance,asmanyelectronicprocessesinsemiconductortechnologyarecontrolledbytheminoritycarriers,thedensityofwhich,beingsmall,maybemorereadilyvaried.
P1829、Onetoonecorrelationsbetweendislocationsandemittertocollectorshortsinbipolartransistors,aswellasavalanchesitesinphotodetectorshavebeenmade,whereasprocessinducedstackingfaultsareknowntoreducethestoragetimeinMOSmemorydevices.P1930、Ifdefectcharacterizationisworthyofaphilosophy,thenitmustbe"donotuseoverkill",orinotherwordsusethesimplesttechniq
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