DS18B20外文翻譯

1、畢業(yè)設(shè)計(jì)外文資料翻譯 外文出處：2007 Second IEEE Conference on Industrial Electronics and Applications學(xué) 院： 信息工程 系：電子信息工程專 業(yè)： 電子信息工程 班 級(jí)： 電子073 學(xué) 號(hào)： 6100207237 學(xué)生姓名： 彭均均 外文原文：A Design of the Temperature Test System Based on Grouping DS18B20LI Ping ZHOU Yucai Xiangjun ZENG YANG Ting-fangChangsha University of Science

2、 and Technology,Changsha 410077, Hunan, P. R. China. Abstract- All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the

3、temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.Key words- DS18B20 Group ,temperatu

4、re test, time spent on the alternate test.I. INTRODUCTIONAs the simple structure, convenient installment, low loss and wide range of temperature test, DS18B20 temperature test sensors are applied to the fields which need the multipoint temperature test, such as the chemical industry, the grain, the

5、environment supervision and so on. Because of the adoption of one bus in the DS18B20 multipoint temperature test system, all DS18B20 are hung on one bus, and then the temperature conversion value of each test point is read by turns. As the conversion value must be read after reading-pin state for 8

6、times, and position and store data must be moved, so time spend much in reading one point of the data system by every time. If the temperature test system is large-scaled, the system loss caused by it is rather much, and then the alternate test speed of the system decreases obviously, which influenc

7、es the efficiency of the multipoint temperature test system seriously. In this paper, DS18B20 are hung on some I/O buses by grouping DS18B20 evenly, and the conversion temperature data is obtained by reading the state of DS18B20, then the system loss decreases and the alternate test speed increases

8、obviously, which wont influence the precision and the reliability of the conversion. A set of multipoint temperature test of artificial environment laboratory is achieved in this paper, which increases the test efficiency of the former system.􀄊 . CHARACTERISTICS OF DS18B20 DS18B20 is the si

9、ngle bus digital temperature sensor from American Dallas Company. DS18B20 is consisted of the 64 figures ROM engraved by laser, the temperature sensitivity component, non-volatile temperature alarms trigger (Device TH and TL).DS18B20 communicates with the microprocessor by the single bus port and th

10、e test range of DS18B20 is from -55 centigrade to +125 centigrade, and the incremental value is 0.5 centigrade. The temperature can be changed into figures within 720ms and each DS18B20 has the sole 64 figures serial number. The specific content is revealed as Fig 1: There are two 8 figures storages

11、 (No.0 and No.1) for storing temperature value in DS18B20. No.0 storage stores complement of the temperature value, and No.1 stores symbols of the temperature value. The user can define non-volatile temperature alarms sets and distinguish the alarms search order and seek the component temperature al

12、arms state outside the scheduled limit. There are two alternative ways of power supply: Signal bus high-level borrow power is adopted, or the +5v power supply externally is adopted directly.Fig 1 DS18B20 64bit ROM. APPLICATION THE GROUPING TEST METHOD This paper illustrates the grouping method with

13、the interface of DS18B20 and 89C52. Assuming the amount of the buses on P1 port is 4 and the temperature test system needs 100 DS18B20 sensors, which can be distributed equally to the 4 I/O lines. If the number of sensors cannot be divided by the number of buses even, the number disparity of sensors

14、on buses is no more than one, which can be handled while reading numbers. The power is supplied externally. Owning to the synchronistic conversion in each DS18B20, the intense current is needed, and the signal bus cannot be used for the power supply, otherwise the system cannot work in order. The sc

15、hematic circuit is shown as Fig 2 (the DS18B20 signal buses of the same group are hung on some buses of P1 port). When read and write the DS18B20, the strict schedule must be kept. First a reversion pulse is sent to all DS18B20. After the reversion, Skip ROM order is sent to each circuitsimultaneous

16、ly from the I/O port, and the conversion order is sent, then all sensors begin transform. After the conversion, Match Rom order is sent to each circuit simultaneously, and 64 bits serial number is sent. DS18B20 is selected for each group, and Scratch Pad data is read. Finally the data is transformed

17、. The data of serial-read is transformed into the actual temperature value. One alternate test is finished after the DS18B20 temperature data is read completely by the cyclical reading for 25 times. The whole flow chart is shown as Fig 3.Fig 3 the diagram of collecting temperature by grouped DS18B20

18、 Now the time-consuming in the test system of the single bus and the grouping analyses method is illustrated respectively. The reversion time sequence and the timesequence of writing and reading one bit for the microprocessor are revealed in figures 4-6. The figure show: The reversion period of DS18

19、B20 is 495us-1020us;the writing period of one bit is 60us-120us;the reading period of one bit is above 60us; the span of writing or reading the next bit is 1us. As the A/D conversion time is 97.35ms (9 precisions), if it is counted by the shortest way, the total time-consuming of alternate test is c

20、alculated respectively as follows:(1) Single bus495us+2*(8*60+7)us+97.35ms+495us+100*(64*60+63+8*60+7+9*60+8)us=552.534ms(2) Grouping mode495us+2*(8*60+7)us+97.35ms+20(64*60+63+8*60+7+9*60+8)us=189.804ms As the small proportion of the numeration system conversion and the storage time in the whole pe

21、riod, the unknown crystal-oscillator frequency, the numeration systemconversion and storage time is not counted. Accordingly, the alternate test time which grouping mode consumes is much shorter than single bus mode obviouslyFig 4 DS18B20 reversion time sequenceFig 4 DS18B20 reversion time sequenceI

22、V. EXAMPLE OF THE DESIGN The asphalt transportation vehicle is the main transportation equipment between the material field and road surface. The unavoidable temperature decreasing because of the asphalt transportation vehicles long working and transportation distance influences the paving quality o

23、f the road surface, the specific measures must be taken according to the heat release of the shell. This paper designed a set of wireless temperature using DS18B20 grouping mode test system for testing the temperature of the asphalt transportation vehicle shell, and the total points is 120. Temperat

24、ure test system software adopts the modular design. The hypogenous machine collects data, stores data, sets up DS18B20, and sends the wireless module and so on. The epigenous machine adopts PC machines, mainly receives the temperature data from the hypogenous machine. The epigenous machine displays,

25、 stores and manages data. The simple communication between people and machines is performed by the epigenous machine. This paper will not illustrate the simple procedure of the epigenous machine in detail. The following is the illustration of parts of hypogenousmachine. including the components of s

26、ystem hardware , software functions and process.A. System hardware Considering the multipoint temperature number of the temporary storage and the considerable internal RAM during the value conversion, the chief controlling chip adopts ATMEL 89C52 Single-Chip Microcomputer with 256 bytes RAM and 8KB

27、E2PROM procedure storage. As the distinguishable code of DS18S20 is read and numbered, the liquid crystal module (Ao Kela Chinese integrated module ofOCMJ Jin Peng Company) and the keyboard module are added. The wireless digital transmission adopts the wireless module PTR2000 in the whole reception-

28、sending form, which may has two amateur bands to choose and the regulative BaudRate ( the max is 20Kbit/s), and the Single-Chip Microcomputer serial port data can be received directly. The system hardware structure is shown as Fig 7:DS18B20, with the power supply, divided into 8 groups hung on P1 po

29、rt (P1.0-P1.7). The wireless module is hung on serial port directly and the hardware watchdog adopts the MAX813 chip. When the power is added to the system, the 89C52 reversion signal is transmitted from the MAX813 reversion pin, and the value of the reversion pulse is 200ms. When the procedure is i

30、n order, a pulse signal must be sent to MAX813 WDI pin in no more than the interval of 1.6s to clear away the watch-dog timer. If the interval is more than 1.6s, the pin does not receive the pulse signal, and then the 89C52 must be reversed. As 120 DS18B20 serial numbers must be stored in the system

31、, the data storage DS1225 (8K) against the power failure is developed.B. System software function and process The software part of the temperature test system numbers DS18B20, collects and transforms data, performs the wireless communication, manages keyboard and so on. For the convenience of the pr

32、ocedure debugging and the reliability, the module design is adopted, mainly including the keyboard processing module, the wireless communication module, the module of temperature collection and processing, the display module and so on. The software flow chart is shown as Fig 8 After the reversion of

33、 add power 89C52 self-checks first, then allocates each branch procedure module. The chief procedure manages the keyboard, initializes the system andtransfers each functional module. The haul line is kept to perform DS18B20 edit mission. 120 points serial number of DS18B20 is read by the keyboard an

34、d display coordination and numbered into DS1225Y. First the wireless module is set up as the reception state to receive the collection parameters and start the order (The transmission content is sent by pack ; the same content is sent for three times ; two out of three logic is performed according t

35、o the bit). The wireless module is set up as the sleep state during the conversion and the transforming state during the temperature data transmission. Packing sends the temperature data and the DS18B20 numbers in the system to epigenous machine. Theparts of collection and conversion start the DS18B

36、20 conversion, read the temperature data by grouping methods, store data and so on. The following procedure is the maincontent of collecting and conversion modules:void Get_ Temperature(void) uchar i,j , temp_ lsb, temp_ msb;for(i=0;i<8;i+)skip_rom(i);/skip over the serial numbers to checkwrite_b

37、ytes(0x44 );/transform the temperature in each circuit at the same timefor(j=0;j<100;j+)/ prolong the time for 0.1s; wait for the end of conversiondelay(1000);For(j=0;j<15;j+) match_ rom(j); read_ scratchpads (j); /each temperature value is read in 8 busesfor(j=0;j<120;j+)temp_lsb = temp_pa

38、dj0 ;/the data conversion of the temperature valuetemp_msb = temp_padj1 ;temp_lsb >>= 4 ; temp_msb <<= 4 ;temp_lsb |=temp_msb; temp_msb = (temp_lsb/10) ;temp_msb <<=4 ; temp_lsb %= 10 ;temp_lsb |=temp_msb; temperature_ velj =temp_lsb;V. CONCLUSION Authors create the following new i

39、deas1）Alternate test time difference of the multipoint temperature test system in the grouping method and the single bus method is analyzed, then the alternate test speed can be increased greatly by grouping method.2）A set of wireless multipoint temperature test system is designed by DS18B20 groupin

40、g method. This system is applied to the technology reform of the asphalt transportation vehicle in some domestic large-scale engineering mechanical company and the good result of the application is achieved.REFERENCES1 ShenJin,SongJingLing. An All-digital Temperature Measuring System Used in Grain B

41、arns.Transaction of the chese society for Agricultural Machinery,2001,(2):89 91.2 LiMinHui, Jung Deqiong. A Device of Temperature Measuremen Made up of DS1820 and AT89C205. Journal of Sichan Normal University 1997,(5):93-963 Qi ZhiCai Gai Shuang. Embedded Control System of the CentralAir conditioner

42、 Room,InstrumentTechnique and Sensor 2002,(5):25-26.4 ZhangPeiren ZhouYanping. A Large-Scale Temperature Alarm System Based on 1 Wire Bus and CAN bus, Control&Automation 2003,(2):25-26譯文：基于DS18B20分組方式溫度測(cè)試系統(tǒng)設(shè)計(jì)摘要：當(dāng)用于多點(diǎn)測(cè)溫時(shí)，所有的DS18B20傳感器都連接在單片機(jī)的某根總線上，采用輪流采集溫度數(shù)據(jù)的方式。當(dāng)系統(tǒng)有多個(gè)傳感器時(shí)，單片機(jī)用于處理溫度數(shù)據(jù)的時(shí)間就會(huì)明顯延長(zhǎng)，從而導(dǎo)

43、致測(cè)溫系統(tǒng)周期增長(zhǎng)。在本文中，采取對(duì)DS18B20合理的分組的方法，并在軟件上采取一定措施，從而明顯的提高交替檢測(cè)速度。關(guān)鍵詞：DS18B20分組 ；溫度測(cè)試；交替檢測(cè)時(shí)間.引言DS18B20溫度傳感器由于其結(jié)構(gòu)簡(jiǎn)單、安裝方便、低損耗以及測(cè)溫范圍寬而被廣泛應(yīng)用于需要多點(diǎn)測(cè)溫的地方，像化工，糧食，環(huán)境監(jiān)測(cè)等等。由于多點(diǎn)溫度測(cè)試系統(tǒng)采用的是單總線方式，所有的DS18B20傳感器掛在一根總線上，然后輪流讀取每一個(gè)測(cè)試點(diǎn)的溫度轉(zhuǎn)換值。由于讀取單個(gè)傳感器的轉(zhuǎn)換值需要讀8次管腳狀態(tài)，并要進(jìn)行移位存儲(chǔ)數(shù)據(jù)，所以系統(tǒng)讀取每一點(diǎn)的數(shù)據(jù)花費(fèi)的時(shí)間不小，如果測(cè)溫系統(tǒng)規(guī)模較大的話，由此造成的系統(tǒng)損耗也是相當(dāng)大的。從而

44、導(dǎo)致系統(tǒng)的交替檢測(cè)速度明顯下降，極大的影響了多點(diǎn)測(cè)溫系統(tǒng)的檢測(cè)效率。本文中，對(duì)DS18B20平均分組并掛到多根I/O線上，通過同時(shí)讀取DS18B20的狀態(tài)得到轉(zhuǎn)換的溫度數(shù)據(jù)，從而明顯提高交替檢測(cè)速度并降低系統(tǒng)開銷，同時(shí)又不影響轉(zhuǎn)換精度及可靠性。本文實(shí)現(xiàn)了一套人工環(huán)境實(shí)驗(yàn)室的多點(diǎn)溫度測(cè)試，明顯提高了原有測(cè)試系統(tǒng)的檢測(cè)效率。.DS18B20的特性DS18B20是由美國(guó)Dallas公司設(shè)計(jì)的單線數(shù)字溫度傳感器它由64位激光刻印ROM、溫敏元件、非易失性溫度報(bào)警觸發(fā)器TH和TL器件三個(gè)部分組成，其與單片機(jī)的通信采用單線接口，DS18B20的測(cè)量范圍是-55到+125，增量值為0.5。溫度變換為數(shù)字可在

45、720ms內(nèi)完成，每一個(gè)DS18B20具有唯一的64位的序列號(hào)（圖1），DS18B20內(nèi)部有兩個(gè)8位存儲(chǔ)器RAM用來儲(chǔ)存溫度值（0號(hào)和1號(hào)），其中0號(hào)存儲(chǔ)器存放溫度值的補(bǔ)碼，1號(hào)存儲(chǔ)器存儲(chǔ)溫度值的符號(hào)。用戶可以定義非易失性的溫度告警設(shè)置并且區(qū)分告警搜索命令，尋求組件溫度警報(bào)狀態(tài)以外的預(yù)定的限制。有兩種供電方式：利用信號(hào)線高電平時(shí)借電供電，或直接用+5V電源。.應(yīng)用分組測(cè)試方法 本文以DS18B20與89C52的接口說明分組測(cè)試方法，假定P1口上的總線數(shù)為4，溫度測(cè)試系統(tǒng)需要100個(gè)DS18B20傳感器，可將100個(gè)傳感器平均分配到4根I/O線上，如果傳感器數(shù)量不能被總線數(shù)整除，可使連在總線上的

46、傳感器數(shù)量差別不超過1個(gè)，這樣讀數(shù)時(shí)就能解決。電源采取外部供電，由于每個(gè)DS18B20都是同步轉(zhuǎn)換，所以需要較強(qiáng)電流，不能用信號(hào)線供電，否則系統(tǒng)無法正常工作。 線路連接如圖2示（同組的DS18B20信號(hào)線都連接在P1口的一根總線上）。當(dāng)對(duì)DS18B20進(jìn)行讀寫時(shí)，必須嚴(yán)格保持時(shí)序要求。首先給所有的DS18B20發(fā)一個(gè)復(fù)位脈沖，復(fù)位后，從各I/O口發(fā)送跳轉(zhuǎn)ROM命令，轉(zhuǎn)換以后，向各路同時(shí)發(fā)匹配ROM命令，接著發(fā)送64位序列號(hào)，每組選擇一個(gè)DS18B20，讀取Scratch Pad 數(shù)據(jù)，最后進(jìn)行數(shù)據(jù)轉(zhuǎn)換，將串行讀取的數(shù)據(jù)轉(zhuǎn)換成實(shí)際值，循環(huán)讀取25次將所有DSl8820溫度數(shù)據(jù)完全讀完，一次交替測(cè)

47、試完成，整個(gè)流程如圖3所示。圖3.DS18B20分組方式溫度采集流程現(xiàn)在來分析單總線方式和分組方式測(cè)試系統(tǒng)耗時(shí)，圖4-6分別為DSl8B20的復(fù)位時(shí)序、單片機(jī)寫一位和讀一位的時(shí)序。DS18B20的復(fù)位時(shí)間為495us一1020us，寫一位時(shí)間為60us一120us，讀一位時(shí)間為60us以上，讀寫相臨一位時(shí)間間隔為1us。因?yàn)锳/D轉(zhuǎn)換時(shí)間為97.35ms（9位精度）,如果按最短時(shí)間計(jì)算，整個(gè)交替檢測(cè)時(shí)間分別為：（1）單總線495us+2f8女60+7)us+9735ms+495us+100"(64*60+63+8*60+7+9*60+8)us=552534ms（2）分組模式495us+28(8"60+7)us+9735ms+20(64+60+63+8+60+7+9460+8)us=189804ms因?yàn)閿?shù)制轉(zhuǎn)換和存儲(chǔ)時(shí)間占整個(gè)交替檢測(cè)時(shí)間很小，以及無法確定晶振頻率，這里就不計(jì)算數(shù)制轉(zhuǎn)換和存儲(chǔ)時(shí)間。因此，分組模式所用時(shí)間明顯少于單總線模式。.設(shè)計(jì)實(shí)例瀝青運(yùn)輸車是用于原料場(chǎng)和路面之間的主要輸送設(shè)備，。由于瀝青轉(zhuǎn)運(yùn)車在高寒地區(qū)作業(yè)或運(yùn)送距離過長(zhǎng)時(shí)不可避免的產(chǎn)生溫降，這會(huì)影響路面的攤鋪質(zhì)量，所以必須根據(jù)外殼的散熱情況采取具體的保溫措施。本文設(shè)計(jì)了一套用于瀝青運(yùn)輸車外殼溫度分布的無線溫度測(cè)試系統(tǒng)基于DS18B20分組方式，總共120個(gè)點(diǎn)。