2023國際IEC太陽能光伏發(fā)電系統(tǒng)標(biāo)準(zhǔn)檢測技術(shù)

國際IEC太陽光電系統(tǒng)之標(biāo)準(zhǔn)與檢測技術(shù)介紹CMS/ITRIChen-Wei

Chen2023.06

saumine@.twCopyright

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ITRI

工業(yè)技術(shù)研究院2太陽光電系統(tǒng)種類與應(yīng)用Copyright

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ITRI

工業(yè)技術(shù)研究院獨(dú)立型太陽光電系統(tǒng)變流器(Inverter)太陽電池組列(PV

Array)直流接線箱交流配電盤備用AC電源太陽光電模組(PV

Module)太陽能電池(Solar

Cell)充電控制器(ChargeController)蓄電池組(Battery)交流負(fù)載8.0008.0008.000監(jiān)測系統(tǒng)(Monitoring

System)Copyright

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工業(yè)技術(shù)研究院4獨(dú)立型太陽光電系統(tǒng)案例無線通信中繼基地臺NASA

HeliosSharp公司外蒙古200kW系統(tǒng)Copyright

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工業(yè)技術(shù)研究院併聯(lián)型太陽光電發(fā)電系統(tǒng)(住宅用)太陽光電產(chǎn)品認(rèn)證之重要性O(shè)therMaterials產(chǎn) 業(yè) 鏈Crystalline

Si Wafer CellsThin

Filma-Si,Cd-Te,

CISIEC61730IEC61646太陽光電產(chǎn)品認(rèn)證 市 場IEC61215UL

1703IEC

62108市場要的需求安全耐用期長滿足符合發(fā)電或建築結(jié)合設(shè)計(jì)的性能遵守承諾的特點(diǎn)Performance太陽光電模組結(jié)合多種不同的物理和化學(xué)特性材料太陽能電池（基片，薄膜）塑膠原料（封裝，接線盒，連接器，電纜等）金屬零件（內(nèi)部電路，框架等）玻璃ModulesCostDurability(Life

Time＞20

Years)6Copyright

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工業(yè)技術(shù)研究院太陽光電產(chǎn)品的環(huán)境試驗(yàn)與標(biāo)準(zhǔn)濕度Humility水分rain,

dew,frost溫度heat,

night-daycycles機(jī)械應(yīng)力wind-,snow

load,hail

impacts輻照sun,

sky7Copyright

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工業(yè)技術(shù)研究院大氣Saltmist,dust,sand,

pollutionPerformance、Safety

、ReliabilityCopyright

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工業(yè)技術(shù)研究院8IEC太陽光電標(biāo)準(zhǔn)CombinerBoxChargeControllerInverterBatteriesAC

LoadGridtied

orStand

alonePV

CellPV

modulesIEC

61215IEC

61646IEC61730(withfire

test)IEC61701Ed.2

(salt)IEC62716

(ammonia)IEC62804

(PID)IEC62784

(DML)IEC

61853Inverter&

BOSIEC

62109IEC

62116IEC

62093IEC

61727SystemIEC

61724IEC

61829IEC

62446IEC

62124StorageIEC

61427-1IEC

61427-2標(biāo)準(zhǔn)編號說 明IEC

60904-12006Measurementofphotovoltaiccurrent-voltage

characteristicsIEC

60904-22007Requirementforreferencesolar

devicesIEC

60904-32008MeasurementprinciplesforterrestrialphotovoltaicsolardeviceswithreferencespectralirradiancedataIEC

60904-42009Referencesolardevices–Proceduresforestablishingcalibration

traceabilityIEC

60904-51993Determinationoftheequivalentcelltemperatureofphotovoltaicdevicesbytheopen-circuitvoltagemethodIEC

60904-72008Computationofspectralmismatcherrorintroducedinthetestingofaphotovoltaic

deviceIEC

60904-81998Measurementofspectralresponseofaphotovoltaic

deviceIEC

60904-92007Solarsimulatorperformance

requirementsIEC

60904-102009Methodsoflinearity

measurement.IEC

608912009ProceduresfortemperatureandirradiancecorrectionstomeasuredI-Vcharacteristicsofcrystallinesiliconphotovoltaic

device9Copyright

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工業(yè)技術(shù)研究院標(biāo)準(zhǔn)編號說 明IEC61215(2005)陸地用晶體矽太陽能組性能測試標(biāo)準(zhǔn)CrystallineSiliconTerrestrialPhotovoltaicModules-DesignQualificationandType

ApprovalIEC61646(2008)陸地用薄膜型太陽能組性能測試標(biāo)準(zhǔn)Thin-filmTerrestrialPhotovoltaicModulesDesignQualification

andType

Approval)IEC61730(2004)太陽能組件安全及性能測試標(biāo)準(zhǔn)PhotovoltaicModuleSafety

QualificationIEC

62108(2007)聚光太陽能接收器和零件之評估標(biāo)準(zhǔn)ConcentratorPhotovoltaic(CPV)ModulesandAssemblies-DesignQualificationandType

ApprovalIEC

61701(2011)太陽光電模組鹽霧腐蝕測試Saltmistcorrosiontestingofphotovoltaic(PV)

modulesIEC62716(2023)太陽光電模組氨氣腐蝕測試Photovoltaic(PV)modules-Ammoniacorrosion

testing10Copyright

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工業(yè)技術(shù)研究院標(biāo)準(zhǔn)編號說 明IEC

61724(1988)太陽光電系統(tǒng)之性能監(jiān)測－量測、數(shù)據(jù)交換與分析指南Photovoltaicsystemperformancemonitoring-Guidelinesformeasurement,dataexchangeand

analysisIEC61727(2004)PV系統(tǒng)併網(wǎng)相容性photovoltaic(PV)systems-Characteristicsoftheutility

interfaceIEC61829(2008)結(jié)晶矽太陽光電陣列之I-V現(xiàn)場測試Crystallinesiliconphotovoltaic(PV)array–On-sitemeasurementof

I-VcharacteristicsIEC62446(2009)併網(wǎng)型太陽光電系統(tǒng)Gridconnectedphotovoltaicsystems-Minimumrequirementsforsystemdocumentation,commissioningtestsand

inspectionIEC62738(under)太陽光電發(fā)電廠設(shè)計(jì)指南與要求Designguidelinesandrecommendationsforphotovoltaicpower

plantsIEC62548(under)太陽光電陣列設(shè)計(jì)要求Photovoltaic(PV)Arrays–Design

requirements11Copyright

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工業(yè)技術(shù)研究院12Copyright

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工業(yè)技術(shù)研究院光譜分布太陽光頻譜的分布約在300nm至4000nm，進(jìn)入大氣層後，光譜各頻段不同程度的反射、散射及吸收使得原本分布的比例改變。13Copyright

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工業(yè)技術(shù)研究院IEC

60904-314Copyright

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工業(yè)技術(shù)研究院cell@STCmodule@STCIn

field@???太陽光電性能檢測議題15Copyright

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工業(yè)技術(shù)研究院40010000300600 800Wavelength

(nm)Irradiance

(W/m2/nm)

Simulator16Copyright

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工業(yè)技術(shù)研究院Reference

spectrum200100Copyright

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工業(yè)技術(shù)研究院170

0765432110203050Current

(A)Voltage

(V)1000W/m2500W/m20765432101030405020Voltage

(V)Current

(A)4075oC

50oC 25oC 0oCIEC

61829Crystallinesiliconphotovoltaic(PV)array–On-sitemeasurementofI-V

characteristics結(jié)晶矽太陽光電陣列之I-V現(xiàn)場測試18Copyright

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ITRI

工業(yè)技術(shù)研究院IEC

61829Usingasuitableradiometer,

checktheuniformityofthein-planeirradianceovertheareatobetestedandselectamoduleonwhichtheirradianceis

typical.Thearraytobemeasuredmustbedisconnectedfromanyload

suchasbatteryorpowerconditioning

equipment.量測步驟Thisprocedureassumescleanmodulesurfaces.Ifsoiledsurfaceconditionsexist,appropriateactionsuchascleaning(ifpractical)shallbetaken.Thestateofcleanliness,whetherornotcleaninghasbeenattempted,shallbe

reported.Recordtheweatherconditions,qualitatively,andperiodicallynotewhenandhowconditionschangeovertheperiodduringwhichI-VCurvesarebeing

taken.Verifythattheenvironmentalconditionsmeettherequirements

ofIEC60904-1,exceptforthe

following:–formeasurementstobeextrapolatedtoSTC,thetotalin-planeirradiancemustbeatleast700W/m2andtheincidentsunbeammustbewithinaconeof45°angularaperturearoundthemodule

normal.Step

1Step

2Step

3Step

4Step

519Copyright

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ITRI

工業(yè)技術(shù)研究院IEC

61829MeasuretheVOCofthereferencePVdeviceanddetermineitsjunctiontemperature

TJRO.DeterminethenominalmoduletemperaturebyeithermethodAormethod

B.Method

AMeasurethetemperatureatthecentreofthebacksurfaceoftheselectedcentral

module(s).CalculatethemeantemperatureTSAfromallselectedmodulesinthearrayandthedifferencedTbetweenthisvalueandthetemperatureof

thecentralselectedmodule

TSM.量測步驟Step

6MeasurethetemperatureTSRofthebacksurfaceatthecentreof

theStep10referencePVdevice.MeasurementsofTSR,VOCandanewmeasurementofTSM(whichiscalledTSM’)shallbemadewithinashortperiodoftime.(i.e.within1

min)Step11Calculatethecorrectedjunctiontemperatureofthemodule

array.Step

7Step

8Step

920Copyright

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工業(yè)技術(shù)研究院IEC

61829量測步驟Step11ScantheI-VcurvebyvaryingtheloadsuchthattherewillbeasufficientnumberofpointstodefineasmoothI-V

characteristic.Step12Calculatethecorrectedjunctiontemperatureofthemodulearrayduringthe

measurement.Correctionprocedureswhenthereferencedevice

temperatureStep13measurementsarenotthesameasthestandardtemperaturefor

whichitscalibrationvalueis

given.Step14ExtrapolatethemeasuredI-VdatatotherequiredAcceptanceTestConditionsbythemethoddescribedinIEC60891.TheRSvaluewilleitherbegivenbythesupplierordeterminedbymeasurementasinIEC

60891.21Copyright

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工業(yè)技術(shù)研究院IEC

61724Photovoltaicsystemperformancemonitoring–Guidelinesformeasurement,dataexchangeand

analysis22Copyright

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工業(yè)技術(shù)研究院IEC

6172423Copyright

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工業(yè)技術(shù)研究院IEC

61724日照計(jì)Reference

cell頻譜響應(yīng)300-4000

(nm)400-1100

(c-Si)反應(yīng)時間Slow(~3-5s)Fast(<1ms)Irradiance

measurement24Copyright

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工業(yè)技術(shù)研究院IEC

61724Copyright

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工業(yè)技術(shù)研究院Irradiancetraceabilityinphotovoltaic(IEC

60904-4)IEC

61724Temperature

measurementAmbient

temperatureModule

temperature26Copyright

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工業(yè)技術(shù)研究院IEC

61724Windspeed

measurementWindspeed

temperature27Copyright

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工業(yè)技術(shù)研究院IEC

61724Electricalproperties

measurementVoltageandcurrent

measurementElectricalpower

measurement28Copyright

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工業(yè)技術(shù)研究院IEC

61724Dataacquisition

system29Copyright

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工業(yè)技術(shù)研究院IEC

61829太陽光電陣列現(xiàn)場電流電壓驗(yàn)證技術(shù)能量30Copyright

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工業(yè)技術(shù)研究院IEC

61829系統(tǒng)設(shè)備介紹日照計(jì)IEC

61829

系統(tǒng)本體環(huán)境溫度計(jì)模組背面溫度計(jì)日晷儀31Copyright

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工業(yè)技術(shù)研究院Copyright

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工業(yè)技術(shù)研究院STC

performanceIrradiance

1000

W/m2Temperature

25

CIEC

61829系統(tǒng)設(shè)備介紹IEC

61829案例南部太陽光電系統(tǒng)現(xiàn)場量測模組STC最大功率並比較與標(biāo)籤額定值(190

W)模組序號已修正之STCPmax(W)STC與模組標(biāo)籤功率相對誤差(%)1203.989+7.42210.964+11.03215.57+13.533Copyright

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ITRI

工業(yè)技術(shù)研究院太陽光電系統(tǒng)性能監(jiān)測技術(shù)能量系統(tǒng)規(guī)格:交流電壓量測範(fàn)圍:

(0~600)

V，精確度

1

%交流電流量測範(fàn)圍:

(0~1000)

A，精確度

1

%輻射強(qiáng)度範(fàn)圍:

(0~1200)

W/m2，精確度

5

%34Copyright

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工業(yè)技術(shù)研究院IEC

61724Copyright

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ITRI

工業(yè)技術(shù)研究院可收納式伸縮支架溫濕度計(jì)記錄控制箱風(fēng)速風(fēng)向計(jì)Porta