2025服務(wù)器產(chǎn)品的安全及電磁兼容性

附錄 GB 1GB GB/T GB GB17625.2 16AGB/Z17625.3 16AGB/Z17625.6 16AGB/T GB/T17626.3 電磁兼容試驗和測量技術(shù)射頻電磁場輻射抗擾度試驗GB/T17626.4 電磁兼容試驗和測量技術(shù)電快速瞬變脈沖群抗擾度試驗GB/T17626.5 電磁兼容試驗和測量技術(shù)浪涌(沖擊)抗擾度試驗GB/T GB/T GB/T GB/T17626.29 電磁兼容試驗和測量技術(shù)直流電源輸入端口電壓暫降、短時中斷和電壓變CISPR32 Electromagneticcompatibilityofmultimediaequipment-EmissionrequirementsCISPR35 Electromagneticcompatibilityofmultimediaequipment-ImmunityrequirementsEN300386 ElectromagneticcompatibilityandRadiospectrumMatters(ERM);Telecommunicationnetworkequipment;ElectroMagneticCompatibility(EMC)IEC/EN55032 Electromagneticcompatibilityofmultimediaequipment—EmissionRequirementsIEC/EN Electromagneticcompatibilityofmultimediaequipment—IEC/EN61000-3-2Electromagneticcompatibility(EMC)–Part3-2:Limits–Limitsforcurrentemissions(equipmentinputcurrent≤16AperIEC/EN61000-3-3Electromagneticcompatibility-Limits-Limitationofvoltagechanges,voltagefluctuationandflickerinpubliclow-voltagesupplysystems,forequipmentwithratedcurrent≤16AperphaseandnotsubjecttoconditionalconnectionIEC/EN61000-3-11Electromagneticcompatibility(EMC)-Part3-11:Limits-Limitationofvoltagechanges,voltagefluctuationsandflickerinpubliclow-voltagesupplysystems–Equipmentwithratedcurrent≤75AandsubjecttoconditionalconnectionIEC/EN61000-3-12Electromagneticcompatibility(EMC)-Part3-12:Limits-Limitsforharmoniccurrentsproducedbyequipmentconnectedtopubliclow-voltagesystemswithinputcurrent>16Aand≤75AperphaseIEC/EN61000-4-2Electromagneticcompatibility-TestingandmeasurementtechniquesElectrostaticdischargeimmunitytest;IEC/EN61000-4-3Electromagneticcompatibility-TestingandmeasurementtechniquesRadiatedIEC/EN61000-4-4 Electromagneticcompatibility-TestingandmeasurementtechniquesElectricalfasttransient/burstimmunitytest;IEC/EN61000-4-5 Electromagneticcompatibility-TestingandmeasurementtechniquesSurgeimmunitytest;IEC/EN61000-4-6 Electromagneticcompatibility-TestingandmeasurementtechniquesImmunitytoconducteddisturbances,inducedbyradio-frequencyfields;IEC/EN61000-4-11 Electromagneticcompatibility-TestingandmeasurementtechniquesVoltagedips,shortinterruptionandvoltagevariationsimmunitytests;IEC60950-1 Informationtechnologyequipment–Safety Part1:GeneralrequirementsEN60950- Informationtechnologyequipment- Part1:GeneralUL60950-1 Informationtechnologyequipment-Safety Part1:GeneralrequirementsIEC60825 SafetyoflaserproductsPart1EquipmentclassificationandrequirementsQ/WRI/FH4020 信息技術(shù)設(shè)備（ITE）informationtechnologyEN61000-3-2ATestCertificatesforElectricalEquipment，CBCertificationBodies的簡稱。性能判據(jù)（criteria）B性能判據(jù)（criteria）C：功能暫時降低或喪失，但需操作者干預(yù)或系統(tǒng)復(fù)位；1IEC60950-EN60950-GB: 2M一次電路－可觸及接地部件（20J;240VA60S。2.556.4IEC60950-1/EN60950-1標準中的相關(guān)規(guī)定。2000米以下地區(qū)使用的設(shè)PCBIEC60950-1/UL60950-1/EN60950-1/GB60825Q/WRI/FH4020《器件選型－安全規(guī)范》關(guān)鍵零部件（PCB基材，風扇，DC/DC模塊，X/Y電容等）需提供有效認證證書（UL/VDE/TUV/CB）IEC60950-1/UL60950-1/EN60950-1/GB4943.1IEC60950-1CBUL60950-1ULEN60950-1CEGB4943.1CCCITECISPR32CISPR35EN55032EN55035。EN300386，適用于面向電信運營商的產(chǎn)品設(shè)計。2（GB9254,EN55032,ENABBAC（GB9254,EN55032,EN300386）ABB（GBGB/ZIEC/EN61000-3-12A類設(shè)備（2.10）各次諧波電AA-1給出的限值。（GBGB/ZIEC/EN61000-3-11EN300386）Pst1.0；Pltd(t)3.3%的時間不大500msdc3.3%；dmax4%；DC（GBAENENBB（GBEN55032EN300386）ABB（GB/TIEC/EN61000-4-2EN300386）4.0kVContactDischarge8.0kVAirDischargecriteriaB6.0kVContactDischarge8.0kVAirDischargecriteriaB(IEC/EN61000-4-6EN150kHzto80MHz150omnSource80%and1.0kHzModulationcriteriaA（GB/TGB/T17618EN300386）80MHzto80%and1.0kHzModulationcriteriaA 80%and1.0kHzModulation （GB/TIEC/EN61000-4-8GB19286）criteriaA（GB/TIEC/EN61000-4-4EN300386）criteriaBcriteriaGB/TIEC/EN61000-4-5EN300386）10/700（5/350）(Tr/Th.,μs)1.0kVcriteriaB1.2/50（8/20）(Tr/Th.,μs)0.5kVcriteriaB線-1.2/50（8/20）(Tr/Thμs)線-1.2/50（8/20）(Tr/Thμs)criteria(IEC/EN61000-4-6EN150kHzto10MHz：3Vrms10MHzto30MHz：3-1Vrms30MHzto80MHz：1Vrms150omnSourceImpedance80%and1.0kHzModulation150kHzto80MHz：3Vrms150omnSourceImpedance80%and1.0kHzModulation（GB/TIEC/EN61000-4-4EN300386）criteria（GB/TIEC/EN61000-4-5EN300386）1kVonDifferential(L-N)criteriaBIEC/EN61000-4-11EN300386）>95%降低，10ms時，criteria>30%降低，500ms時，criteria>95%降低，5s時，criteria(EN61000-4-GB/T17626.6EN150kHzto10MHz：3Vrms10MHzto30MHz：3-1Vrms30MHzto80MHz：1Vrms150omnSourceImpedance80%and1.0kHzModulationcriteriaA150kHzto80MHz：3Vrms150omnSourceImpedance80%and1.0kHzModulationcriteriaA（GB/TIEC/EN61000-4-4EN300386）criteriaBcriteriaB（GB/TIEC/EN61000-4-5EN300386）1.2/50（8/20）(Tr/Thμs)0.5kVcriteriaBGB/T17626.6EN150kHzto10MHz：3Vrms1